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Al-Bahir Journal for Engineering and Pure Sciences

Abstract

This paper deals with the review of various existing technique for the microcracks detection in silicon solar cell and wafer. In addition to this, we proposed a novel approach for the machine learning technique for the inspection of the cracks those are existed in the solar cell and wafer and not able to detect by the naked eyes. There are many techniques have been developed by the various researchers around the world to inspect solar cells for defect. All the techniques discussed in this article having some features and some weakness too. This paper present here gives the two-fold solution for the microcrack detection that will benefit the scientist and engineers for the development of the machine vision system to find out the cracks in the solar cells and solar wafers.

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